Trainings

Atomic Force Microscopy (AFM) is a powerful and versatile tool used to study the surface properties of materials at the atomic or nanometer scale. Unlike traditional microscopes that rely on light or electrons to form an image, AFM operates by physically "feeling" the surface with a sharp probe, known as a cantilever, to generate high-resolution images. This method allows scientists and engineers to explore the topography, mechanical properties, and even chemical interactions on a surface with unprecedented detail.

The Cell Staining course provides a comprehensive overview of the principles and practical applications of fluorescence-based cell staining methods. It focuses on the fundamental concepts of fluorescence, the selection and utilization of fluorescence dyes for visualizing organelles, immunostaining techniques, and live-cell imaging approaches.

Confocal Imaging Concept The primary functions of a confocal microscope are to produce a point source of light and reject out-of-focus light, which provides the ability to image deep into tissues with high resolution, and optical sectioning for 3D reconstructions of imaged samples. The basic principle of confocal microscopy is that the illumination and detection optics are focused on the same diffraction-limited spot, which is moved over the sample to build the complete image on the detector.

Hyperspectral Imaging Concept. Hyperspectral imaging is a powerful new technology based on spectroscopy. It is based on collecting hundreds of images at different wavelengths from the same spatial area. The collected data form a hyperspectral cube, in which two dimensions represent the spatial coordinates (x,y), while the third coordinate shows wavelength (L).

Fiji is free software used by scientists around the world to analyze images. The course includes a description of the principles and rules of working in Fiji and practical exercises on using this program for processing 2D and 3D images, selecting regions of interest, calculating their number, area, brightness and other parameters.