Trainings

Atomic Force Microscopy (AFM) is a powerful and versatile tool used to study the surface properties of materials at the atomic or nanometer scale. Unlike traditional microscopes that rely on light or electrons to form an image, AFM operates by physically "feeling" the surface with a sharp probe, known as a cantilever, to generate high-resolution images. This method allows scientists and engineers to explore the topography, mechanical properties, and even chemical interactions on a surface with unprecedented detail.