AFM Concept
Atomic Force Microscopy is a very high-resolution type of scanning probe microscopy with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by “feeling” or “touching” the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. The AFM three major abilities: force measurement, topographic imaging, and manipulation, make it a powerful method of investigation and visualization of a various life science targets. Additional information about the basics of AFM can be found on wikipedia page or by watching this youtube video.
AFM Workshop system availble at OIPH
The LS-AFM is a tip-scanning AFM designed specifically for life science applications when paired with an inverted fluorescent microscope. The product includes everything required for AFM scanning: AFM Stage, Inverted Microscope Adaptation Plate, Ebox, Manuals, Cables, and AFM-Control Software. The LS-AFM is designed for the most widely used types of measurements made with an AFM, including measuring F/D curves and imaging cells in a dry and liquid environment. PDF manual.
